Optical film characterization

Optical film characterization

PlanOpSim has used a number of optical techniques for characterization and parameter extraction from thin film materials. The most important optical parameters extracted are:

  • Refractive index and absorption coefficient

  • Haze and transmission

  • Optical retardation of birefringent materials

  • Film thickness

  • Transmission and reflection

PlanOpSim can help you with these techniques:

  • Spectroscopic Ellipsometry: is the reference method for determining the refractive index of thin films.
  • Optical retardation measurements using a Babinet compensator: the most accurate method to determine the retardation factor of a birefringent film.
  • Transmission and reflection spectrometry: is an alternative method to determine the refractive index and asbsorption coefficient. Generally thicker films are needed than in ellipsometric measurements
  • Haze & Transmission: Haze is an important experimental parameter for scattering and structured films. The measurement must be carefully conducted with an integrating sphere.

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